[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Invisible Defect Identification by Electrical Nanoprobing Analysis
Ng, P.T., Chen, C.Q., Tam, Y.S., Yip, K.H., Teo, Angela, Ang, G.H., Mai, Z.H., Lam, JeffreyYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452595
File:
PDF, 621 KB
english, 2018