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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation
Teramoto, Akinobu, Hashimoto, Keiichi, Suwa, Tomoyuki, Tsuchimoto, Jun-ichi, Hayashi, Marie, Park, Hyeonwoo, Sugawa, ShigetoshiYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353664
File:
PDF, 832 KB
english, 2018