An Experimental Approach to Characterizing the Channel...

IEEE Journal of the Electron Devices Society 2018 Vol. 6

An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET

Hsieh, E Ray, Jiang, Meng-Ru, Lin, Jian-Li, Chung, Steve S., Chen, Tse Pu, Huang, Shih An, Chen, Tai-Ju, Cheng, Osbert
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Year:
2018
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2018.2859276
File:
PDF, 1.97 MB
english, 2018
Conversion to is in progress
Conversion to is failed