A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance
Hachem, D., Trémouilles, D., Morancho, F., Toulon, G.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.119
Date:
September, 2018
File:
PDF, 1.62 MB
english, 2018