XPS investigations of MOCVD tin oxide thin layers on Si...

Results in Physics 2018 / 12 Vol. 11

XPS investigations of MOCVD tin oxide thin layers on Si nanowires array

Turishchev, S.Yu., Chuvenkova, O.A., Parinova, E.V., Koyuda, D.A., Chumakov, R.G., Presselt, M., Schleusener, A., Sivakov, V.
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Volume:
11
Language:
english
Journal:
Results in Physics
DOI:
10.1016/j.rinp.2018.09.046
Date:
December, 2018
File:
PDF, 536 KB
english, 2018
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