New Possibilities for State-of-the-Art Electron Microscopy...

Microscopy and Microanalysis 2018 / 08 Vol. 24; Iss. S1

New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors

Schmid, Maximilian, Liebel, Andreas, Moldovan, Grigore, Lackner, Robert, Steigenhöfer, Daniel, Niculae, Adrian, Soltau, Heike
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Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618003744
Date:
August, 2018
File:
PDF, 348 KB
english, 2018
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