A Highly Reliable and Unbiased PUF Based on Differential...

IEEE Electron Device Letters 2018 / 8 Vol. 39; Iss. 8

A Highly Reliable and Unbiased PUF Based on Differential OTP Memory

Sadana, S., Lele, A., Tsundus, S., Kumbhare, P., Ganguly, U.
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Volume:
39
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2844557
Date:
August, 2018
File:
PDF, 799 KB
english, 2018
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