Study on power cycling test with different control strategies
Zeng, G., Wenisch-Kober, F., Lutz, J.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.088
Date:
September, 2018
File:
PDF, 2.65 MB
english, 2018