Bias in resistance gene prediction due to repeat masking

Bias in resistance gene prediction due to repeat masking

Bayer, Philipp E., Edwards, David, Batley, Jacqueline
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Volume:
4
Language:
english
Journal:
Nature Plants
DOI:
10.1038/s41477-018-0264-0
Date:
October, 2018
File:
PDF, 852 KB
english, 2018
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