MONOX: a characterization tool for the X-UV range
André, J.-M., Avila, A., Barchewitz, R., Benbalagh, R., Delaunay, R., Druart, D., Jonnard, P., Ringuenet, H.Volume:
31
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2005047
Date:
August, 2005
File:
PDF, 332 KB
english, 2005