Application of MIS-CELIV technique to measure hole mobility...

AIP Advances 2018 / 10 Vol. 8; Iss. 10

Application of MIS-CELIV technique to measure hole mobility of hole-transport material for organic light-emitting diodes

Katagiri, Chiho, Yoshida, Tsukasa, White, Matthew Schuette, Yumusak, Cigdem, Sariciftci, Niyazi Serdar, Nakayama, Ken-ichi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5045711
Date:
October, 2018
File:
PDF, 530 KB
english, 2018
Conversion to is in progress
Conversion to is failed