Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon
Tanner, Brian, Allen, David, Wittge, Jochen, Danilewsky, Andreas, Garagorri, Jorge, Gorostegui-Colinas, Eider, Elizalde, M., McNally, PatrickVolume:
7
Language:
english
Journal:
Crystals
DOI:
10.3390/cryst7110347
Date:
November, 2017
File:
PDF, 10.55 MB
english, 2017