Unified view on energy and electrical failure of the short-circuit operation of IGBTs
Baburske, R., Niedernostheide, F.-J., Schulze, H.-J., Bhojani, R., Kowalsky, J., Lutz, J.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.06.091
Date:
September, 2018
File:
PDF, 2.63 MB
english, 2018