Effect of HTRB lifetest on AlGaN/GaN HEMTs under different...

Microelectronics Reliability 2018 / 09 Vol. 88-90

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses

Chihani, Omar, Theolier, Loic, Bensoussan, Alain, Deletage, Jean-Yves, Durier, André, Woirgard, Eric
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Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.076
Date:
September, 2018
File:
PDF, 923 KB
english, 2018
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