TCAD investigation on hot-electron injection in...

Microelectronics Reliability 2018 / 09 Vol. 88-90

TCAD investigation on hot-electron injection in new-generation technologies

Reggiani, S., Rossetti, M., Gnudi, A., Tallarico, A.N., Molfese, A., Manzini, S., Depetro, R., Croce, G., Sangiorgi, E., Fiegna, C.
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Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.097
Date:
September, 2018
File:
PDF, 1.16 MB
english, 2018
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