On-line solder layer degradation measurement for SiC-MOSFET...

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition

Luo, Haoze, Reigosa, Paula Diaz, Iannuzzo, Francesco, Blaabjerg, Frede
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.128
Date:
September, 2018
File:
PDF, 1.55 MB
english, 2018
Conversion to is in progress
Conversion to is failed