![](/img/cover-not-exists.png)
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition
Luo, Haoze, Reigosa, Paula Diaz, Iannuzzo, Francesco, Blaabjerg, FredeVolume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.128
Date:
September, 2018
File:
PDF, 1.55 MB
english, 2018