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Characterization of small-scale surface topography using transmission electron microscopy
Khanal, Subarna Raj, Gujrati, Abhijeet, Vishnubhotla, Sai Bharadwaj, Nowakowski, Pawel, Bonifacio, Cecile, Pastewka, Lars, Jacobs, Tevis DavidLanguage:
english
Journal:
Surface Topography: Metrology and Properties
DOI:
10.1088/2051-672X/aae5b3
Date:
October, 2018
File:
PDF, 1.54 MB
english, 2018