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[IEEE 2018 91st ARFTG Microwave Measurement Conference (ARFTG) - Philadelphia, PA (2018.6.15-2018.6.15)] 2018 91st ARFTG Microwave Measurement Conference (ARFTG) - UV Thermal Imaging of RF GaN Devices with GaN Resistor Validation
Kendig, Dustin, Pavlidis, Georges, Graham, Samuel, Reiter, Justin, Gurr, Michael, Altman, David, Huerster, Stephen, Shakouri, AliYear:
2018
Language:
english
DOI:
10.1109/ARFTG.2018.8423808
File:
PDF, 1.01 MB
english, 2018