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[IEEE 2018 Annual Reliability and Maintainability Symposium (RAMS) - Reno, NV, USA (2018.1.22-2018.1.25)] 2018 Annual Reliability and Maintainability Symposium (RAMS) - Method to Determine Test Profile in Step-Stress Accelerated RDT Under Type-I Censoring
Peng, Li, Wei, Dang, Mincheng, Xin, Kai, Liu, Tianji, ZouYear:
2018
Language:
english
DOI:
10.1109/RAM.2018.8463104
File:
PDF, 3.00 MB
english, 2018