Using Ridge Regression Models to Estimate Grain Yield from...

Remote Sensing 2015 / 02 Vol. 7; Iss. 2

Using Ridge Regression Models to Estimate Grain Yield from Field Spectral Data in Bread Wheat (Triticum Aestivum L.) Grown under Three Water Regimes

Hernandez, Javier, Lobos, Gustavo, Matus, Iván, del Pozo, Alejandro, Silva, Paola, Galleguillos, Mauricio
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Volume:
7
Language:
english
Journal:
Remote Sensing
DOI:
10.3390/rs70202109
Date:
February, 2015
File:
PDF, 5.57 MB
english, 2015
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