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Contactless nondestructive method for determination of the carrier diffusion length in semiconductors and dielectrics
Manukhov, V V, Fedortsov, A BVolume:
816
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/816/1/012041
Date:
March, 2017
File:
PDF, 917 KB
english, 2017