A novel crowdsourcing platform for microelectronics...

Microelectronics Reliability 2018 / 09 Vol. 88-90

A novel crowdsourcing platform for microelectronics counterfeit defect detection

Ahmadi, Bahar, Tavousi, Pouya, Favata, Joseph, Shahbeigi-Roodposhti, Peiman, Pelapur, Rengarajan, Shahbazmohamadi, Sina
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Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.107
Date:
September, 2018
File:
PDF, 1.92 MB
english, 2018
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