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Influence of thermal exposure upon mechanical/electrical properties and microstructure of sintered micro-porous silver
Choe, Chanyang, Noh, Seungjun, Chen, Chuantong, Kim, Dongjin, Suganuma, KatsuakiVolume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.048
Date:
September, 2018
File:
PDF, 3.15 MB
english, 2018