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An efficient EDAC approach for handling multiple bit upsets...

Microelectronics Reliability 2018 / 09 Vol. 88-90

An efficient EDAC approach for handling multiple bit upsets in memory array

Goerl, Roger C., Villa, Paulo R.C., Poehls, Letícia B., Bezerra, Eduardo A., Vargas, Fabian L.
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Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.060
Date:
September, 2018
File:
PDF, 867 KB
english, 2018
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