Simulation and modelling of long term reliability of digital circuits implemented in FPGA
Aguirre Morales, J.D., Marc, F., Bensoussan, A., Durier, A.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.151
Date:
September, 2018
File:
PDF, 798 KB
english, 2018