Simulation and modelling of long term reliability of...

Simulation and modelling of long term reliability of digital circuits implemented in FPGA

Aguirre Morales, J.D., Marc, F., Bensoussan, A., Durier, A.
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Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.151
Date:
September, 2018
File:
PDF, 798 KB
english, 2018
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