XPS Depth Profiling of Air-Oxidized Nanofilms of NbN on GaN...

Journal of Physics Conference Series 2017 / 11 Vol. 917

XPS Depth Profiling of Air-Oxidized Nanofilms of NbN on GaN Buffer-Layers

Lubenchenko, A.V., Batrakov, A.A., Krause, S., Pavolotsky, A.B., Shurkaeva, I. V., Ivanov, D.A., Lubenchenko, O.I.
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Volume:
917
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/917/9/092001
Date:
November, 2017
File:
PDF, 1.13 MB
english, 2017
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