![](/img/cover-not-exists.png)
Analysis of NBTI Degradation in nMOS-Capacitors and nMOSFETs
Benabdelmoumene, Abdelmadjid, Djezzar, Boualem, Chenouf, Amel, Zatout, Boumediene, Kechouane, MohamedYear:
2018
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2018.2874359
File:
PDF, 1.26 MB
english, 2018