Solving 28 nm I/O circuit reliability issue due to IC design weakness
Low, Yi Chao, Tan, P.K., Tan, S.L., Zhao, Y.Z., Lam, J.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.06.082
Date:
September, 2018
File:
PDF, 3.18 MB
english, 2018