A Method to Reduce the Effect on Image Quality Caused by Resistance of Column Bus
Xu, Jiangtao, Li, Wei, Nie, Kaiming, Han, Liqiang, Zhao, XiyangYear:
2018
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2018.2870858
File:
PDF, 2.42 MB
english, 2018