[ACM Press the 33rd ACM/IEEE International Conference -...

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[ACM Press the 33rd ACM/IEEE International Conference - Montpellier, France (2018.09.03-2018.09.07)] Proceedings of the 33rd ACM/IEEE International Conference on Automated Software Engineering - ASE 2018 - Concolic testing for deep neural networks

Sun, Youcheng, Wu, Min, Ruan, Wenjie, Huang, Xiaowei, Kwiatkowska, Marta, Kroening, Daniel
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Year:
2018
Language:
english
DOI:
10.1145/3238147.3238172
File:
PDF, 1.16 MB
english, 2018
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