Development of highly reliable ferroelectric random access...

Japanese Journal of Applied Physics 2018 / 11 Vol. 57; Iss. 11S

Development of highly reliable ferroelectric random access memory and its Internet of Things applications

Eshita, Takashi, Wang, Wensheng, Nomura, Kenji, Nakamura, Ko, Saito, Hitoshi, Yamaguchi, Hideshi, Mihara, Satoru, Hikosaka, Yukinobu, Kataoka, Yuji, Kojima, Manabu
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Volume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.11UA01
Date:
November, 2018
File:
PDF, 786 KB
english, 2018
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