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Thermal Transient Extraction for GaN HEMTs by Frequency-Resolved Gate Resistance Thermometry with Sub-100 ns Time Resolution
Cutivet, Adrien, Bouchilaoun, Meriem, Hassan, Bilal, Rodriguez, Christophe, Soltani, Ali, Boone, François, Maher, HassanLanguage:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201800503
Date:
October, 2018
File:
PDF, 1018 KB
english, 2018