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Correlation between pit formation and phase separation in thick InGaN film on a Si substrate
Woo, Hyeonseok, Jo, Yongcheol, Kim, Jongmin, Cho, Sangeun, Roh, Cheong Hyun, Lee, Jun Ho, Kim, Hyungsang, Hahn, Cheol-Koo, Im, HyunsikLanguage:
english
Journal:
Current Applied Physics
DOI:
10.1016/j.cap.2018.10.002
Date:
October, 2018
File:
PDF, 2.54 MB
english, 2018