Spectral fit refinement in XPS analysis technique and its...

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Journal of Electron Spectroscopy and Related Phenomena 2018 / 9

Spectral fit refinement in XPS analysis technique and its practical applications

Boryakov, A.V., Surodin, S.I., Kryukov, R.N., Nikolichev, D.E., Zubkov, S. Yu.
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Language:
english
Journal:
Journal of Electron Spectroscopy and Related Phenomena
DOI:
10.1016/j.elspec.2017.11.004
Date:
September, 2018
File:
PDF, 620 KB
english, 2018
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