Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources
Ciappa, Mauro, Pang, Ying, Sun, ChenchenVolume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.129
Date:
September, 2018
File:
PDF, 1.54 MB
english, 2018