Normalized differential conductance to study current...

Microelectronics Reliability 2018 / 12 Vol. 91

Normalized differential conductance to study current conduction mechanisms in MOS structures

Nouibat, T.H., Messai, Z., Chikouch, D., Ouennoughi, Z., Rouag, N., Rommel, M., Frey, L.
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Volume:
91
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.10.001
Date:
December, 2018
File:
PDF, 1.24 MB
english, 2018
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