Electronic noise due to temperature differences in atomic-scale junctions
Lumbroso, Ofir Shein, Simine, Lena, Nitzan, Abraham, Segal, Dvira, Tal, OrenVolume:
562
Language:
english
Journal:
Nature
DOI:
10.1038/s41586-018-0592-2
Date:
October, 2018
File:
PDF, 5.60 MB
english, 2018