In situ wavelength calibration system for the...

Review of Scientific Instruments 2018 / 10 Vol. 89; Iss. 10

In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., Traverso, P., Bitter, M., Hill, K., Reinke, M.
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Volume:
89
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5038809
Date:
October, 2018
File:
PDF, 1.69 MB
english, 2018
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