[ACM Press the 2017 Workshop - Washington, DC, USA (2017.06.26-2017.06.26)] Proceedings of the 2017 Workshop on Fault-Tolerance for HPC at Extreme Scale - FTXS '17 - Understanding the Spatial Characteristics of DRAM Errors in HPC Clusters
Patwari, Ayush, Laguna, Ignacio, Schulz, Martin, Bagchi, SaurabhYear:
2017
Language:
english
DOI:
10.1145/3086157.3086164
File:
PDF, 2.02 MB
english, 2017