Porosity and roughness determination of porous silicon thin films by genetic algorithms
Ramirez-Gutierrez, C.F., Castaño-Yepes, J.D., Rodriguez-Garcia, M.E.Volume:
173
Language:
english
Journal:
Optik
DOI:
10.1016/j.ijleo.2018.08.019
Date:
November, 2018
File:
PDF, 1.24 MB
english, 2018