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AIP Conference Proceedings [Author(s) 44TH ANNUAL REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLUME 37 - Provo, Utah, USA (16–21 July 2017)] - Accelerated defect visualization of microelectronic systems using binary search with fixed pitch-catch distance laser ultrasonic scanning
Park, Byeongjin, Sohn, HoonVolume:
1949
Year:
2018
Language:
english
DOI:
10.1063/1.5031631
File:
PDF, 1.82 MB
english, 2018