Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials
Shim, Jaewoo, Bae, Sang-Hoon, Kong, Wei, Lee, Doyoon, Qiao, Kuan, Nezich, Daniel, Park, Yong Ju, Zhao, Ruike, Sundaram, Suresh, Li, Xin, Yeon, Hanwool, Choi, Chanyeol, Kum, Hyun, Yue, Ruoyu, Zhou, GuaLanguage:
english
Journal:
Science
DOI:
10.1126/science.aat8126
Date:
October, 2018
File:
PDF, 4.22 MB
english, 2018