A body built-in cell for detecting transient faults and...

Microelectronics Reliability 2018 / 09 Vol. 88-90

A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems

Ferreira de Paiva Leite, Thiago, Fesquet, Laurent, Possamai Bastos, Rodrigo
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Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.069
Date:
September, 2018
File:
PDF, 703 KB
english, 2018
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