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Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
Villa, Emanuele, Garnier, Audrey, Reverdy, AntoineVolume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.073
Date:
September, 2018
File:
PDF, 3.78 MB
english, 2018