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[IEEE 2018 Annual Reliability and Maintainability Symposium (RAMS) - Reno, NV (2018.1.22-2018.1.25)] 2018 Annual Reliability and Maintainability Symposium (RAMS) - A Copula-Based Multivariate Degradation Analysis for Reliability Prediction
Fang, Guanqi, Pan, Rong, Hong, YiliYear:
2018
Language:
english
DOI:
10.1109/RAM.2018.8463026
File:
PDF, 3.07 MB
english, 2018