Interdiffusion in as-deposited Ni/Ti multilayer thin films...

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Materials Letters 2018 / 10

Interdiffusion in as-deposited Ni/Ti multilayer thin films analyzed by atom probe tomography

Aboulfadl, Hisham, Seifried, Fabian, Stüber, Michael, Mücklich, Frank
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Language:
english
Journal:
Materials Letters
DOI:
10.1016/j.matlet.2018.10.085
Date:
October, 2018
File:
PDF, 869 KB
english, 2018
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