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[IEEE 2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC (2017.10.10-2017.10.12)] 2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Effect of Super Resolution on High Dimensional Features for Unsupervised Face Recognition in the Wild
ElSayed, Ahmed, Mahmood, Ausif, Sobh, TarekYear:
2017
Language:
english
DOI:
10.1109/AIPR.2017.8457967
File:
PDF, 454 KB
english, 2017