[IEEE 2017 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE) - Dehradun (2017.12.18-2017.12.19)] 2017 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE) - Orthopedic X-ray Image Enhancement Based on Wavelet Transform and Histogram Matching
Sorwar, Tasnim, Parvez Sazzad, Z. M.Year:
2017
Language:
english
DOI:
10.1109/WIECON-ECE.2017.8468886
File:
PDF, 1.81 MB
english, 2017