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[ASME ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Brooklyn, New York, USA (August 3–6, 2008)] Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems - The Effect of Sub-Wavelength Structure Morphology on Anti-Reflection Properties
Lin, Hung-Yi, Tsai, Jen-Hui, Chang, Shuo-Hung, Wu, Tung-Chuan, Wei, Mao-KuoYear:
2008
Language:
english
DOI:
10.1115/DETC2008-49647
File:
PDF, 804 KB
english, 2008