Determination of rhombohedral structure of BiFeO 3 single-domain-like films grown on SrTiO 3 and LaAlO 3 substrates by X-ray diffraction using $(2\bar{1}\bar{3})_{\text{hex}}$
Ichinose, Tomohiro, Yasui, Shintaro, Bae, In-Tae, Naganuma, HiroshiVolume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.0902BC
Date:
September, 2018
File:
PDF, 989 KB
english, 2018